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Custom
Inspection System |
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Our systems are usually designed to
collect data samples at a fixed resolution based on the sensor probe locations
at intervals ranging from one sample per 1/16 of an inch, to one per 1/64 of an
inch, to one per millimeter, depending on the inspection density requirements.
Note that the data samples are velocity independent when using fixed distance
increment pulsing, and thus provide a much greater consistency of test results
over multiple tests than other vendor's systems which utilize a fixed repetition
rate. However, our systems can also be configured to test at a fixed
repetition rate depending on our clients' specification requirements.
An operator-friendly, customized
Windows 9X/NT user interface is designed to meet the needs of the application.
Customized test reports are generated as required by the customer.
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